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1
Phase Microscopy: Principles and Applications
John Wiley & Sons, Inc.
Alva H.
,
et al. Bennett
wave
particle
optical
waves
deviated
diffraction
path
undeviated
microscopy
surround
amplitude
specimen
microscope
contrast
wavelength
plane
conjugate
condenser
difference
objective
particles
equal
resultant
brightness
diaphragm
rays
elementary
microscopes
incident
phenomena
complementary
interference
retarded
absorbing
amplitudes
method
portion
theorem
retardation
zero
appear
increased
specimens
appears
differ
geometrical
microscopic
whereas
absorption
background
Godina:
1951
Jezik:
english
Fajl:
PDF, 21.22 MB
Vaši tagovi:
0
/
0
english, 1951
2
Electron diffraction in the transmission electron microscope
Garland Science
Champness
,
Pamela E
diffraction
figure
electron
lattice
planes
axis
plane
crystal
reflections
reciprocal
symmetry
lens
specimen
angle
parallel
spots
shown
kikuchi
spot
cubic
diffracted
aperture
hkl
axes
reflection
glide
centred
bragg
microscope
sphere
objective
intensity
indices
crystals
appendix
cbed
distance
electrons
shows
spacing
hexagonal
perpendicular
groups
rotation
tilt
absences
scattering
reflecting
atoms
orientation
Godina:
2020
Jezik:
english
Fajl:
PDF, 21.19 MB
Vaši tagovi:
0
/
0
english, 2020
3
Phase Microscopy
Benneth
,
Jupnik
,
Osterberg & Richards
diffraction
contrast
microscopy
objective
optical
plates
plane
transmission
bundle
grating
microscope
amplitude
granules
path
method
detail
technique
difference
wave
nuclear
richards
specimen
zero
oxytricha
bennett
chromosomes
fibers
jupnik
nuclei
undeviated
annular
deviated
illuminated
osterberg
specimens
absorbing
cleavage
figs
function
nucleus
aperture
chromatin
clarite
conjugation
materials
ratio
0.25a
bifaria
cases
details
Godina:
1946
Jezik:
english
Fajl:
PDF, 13.89 MB
Vaši tagovi:
0
/
0
english, 1946
4
The production of elliptic interferences in relation to interferometry 2.
Carnegie Institution
Carl Barus
chamber
grating
nuclei
equation
method
slit
interferences
temperature
exhaustion
spectrum
rays
persistent
interferometry
experiments
values
micrometer
telescope
ellipses
apparatus
fringes
angle
coronas
adjustment
displacement
adiabatic
centimeter
mirror
vacuum
interference
refraction
rings
parallel
expansion
inch
incidence
spectra
wave
collimator
distance
ions
obtained
tube
gratings
observed
effect
larger
thickness
total
chambers
corresponding
Godina:
1913
Jezik:
english
Fajl:
PDF, 5.46 MB
Vaši tagovi:
0
/
0
english, 1913
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